ASR6601 Test Report

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Introduction

About This Document

This document provides the test report for IoT LPWAN SoC ASR6601.

Included Chip Models

The product models corresponding to this document are as follows.

Model

Flash

SRAM

Core

Package

Frequency

ASR6601SE

256 KB

64 KB

32-bit 48 MHz Arm China STAR-MC1

QFN68, 8*8 mm

150 ~ 960 MHz

ASR6601CB

128 KB

16 KB

32-bit 48 MHz Arm China STAR-MC1

QFN48, 6*6 mm

150 ~ 960 MHz

ASR6601SER

256 KB

64 KB

32-bit 48 MHz Arm China STAR-MC1

QFN68, 8*8 mm

150 ~ 960 MHz

ASR6601CBR

128 KB

16 KB

32-bit 48 MHz Arm China STAR-MC1

QFN48, 6*6 mm

150 ~ 960 MHz

Copyright Notice

© 2021 ASR Microelectronics Co., Ltd. All rights reserved. No part of this document can be reproduced, transmitted, transcribed, stored, or translated into any language in any form or by any means without the written permission of ASR Microelectronics Co., Ltd.

Trademark Statement

ASR and ASR Microelectronics Co., Ltd. are trademarks of ASR Microelectronics Co., Ltd.

Other trade names, trademarks, and registered trademarks mentioned in this document are the property of their respective owners and are hereby declared.

Disclaimer

ASR does not give any warranty of any kind and may make improvements and/or changes in this document or in the product described in this document at any time.

This document is only used as a guide, and no contents in the document constitute any form of warranty. Information in this document is subject to change without notice.

All liability, including liability for infringement of any proprietary rights caused by using the information in this document, is disclaimed.

Revision History

Date

Version

Release Notes

2021.05

V1.0.0

First release.

1. Test Overview

1.1 Hardware

68-Pin ASR6601-SE V1.0 Development Board

1.2 Software

ASR6601 V1.0 SDK

1.3 Equipment

Agilent N5182B and Agilent N9020A

1.4 Test Items and Results Summary

image1

2. Test Implementation

2.1 TX Test

2.1.1 Setup TX Test Environment

image2

2.1.2 Frequency Offset Test

  1. Test Method

  1. Frequency setting:

  • Set to LoRa CW mode with 470.0 MHz frequency

  • Set the power to 22.0 dBm

  1. Spectrum analyzer setting:

  • Center frequency is 470.0 MHz, Span is 2 MHz, Ref amp is 25.0 dBm

  • Measure the CW frequency with the marker of the spectrum analyzer

  1. Illustration

image3

  1. Test Result

SN

Set (MHz)

Test (MHz)

PPM

1#

470.000

469.9980

4.25

2.1.3 Transmit Power Test

  1. Test Method

  1. Frequency setting:

  • Set to LoRa CW mode with 470.0 MHz frequency

  • Set the power to 22 dBm

  1. Spectrum analyzer setting:

  • Set frequency point at 1st, 2nd, 3rd, 4th and 5th of the basic frequency

  • Span is 2 MHz (or 5 MHz), Ref amp is 25 dBm

  • Max Hold mode

  1. Illustration

image4

  1. Test Result

Maximum Transmit Power Test Result

SN

Frequency (MHz)

Set (dBm)

Basic (dBm)

1#

470

22

21.06

2#

470

22

20.97

2.1.4 Harmonic Test

  1. Test Method

  1. Frequency settings

  • Set to LoRa CW mode with 470.0 MHz frequency

  • Set the power to 22 dBm

  1. Spectrum analyzer settings

  • Set frequency point at 1st, 2nd, 3rd, 4th and 5th of the basic frequency

  • Span is 2 MHz (or 5 MHz), Ref amp is 25 dBm

  • Max Hold mode

  1. Illustration

image5

2nd/3rd/4th/5th Harmonic Test

  1. Test Result

SN

Frequency (MHz)

Set (dBm)

Basic (dBm)

2nd (dBm)

3rd (dBm)

4th (dBm)

5th (dBm)

1#

470

22

21.06

-46.94

-50.74

-55.80

-60.41

2#

470

22

20.97

-45.42

-49.57

-56.22

-59.28

2.1.5 Phase Noise Test

  1. Test Method

  1. Frequency setting:

  • Set to LoRa CW mode with 470.0 MHz frequency

  • Set the power to 22 dBm

  1. Spectrum analyzer setting:

  • Maker -> Delta, Function -> maker noise

  • Span is 2 MHz (or 5 MHz), Ref amp is 25 dBm

  • Max Hold mode

  1. Illustration

image6

  1. Test Result

SN

Frequency (MHz)

ACT (MHz)

Phase Noise (dB/Hz)

1#

470

469.999

-98.653

2#

470

469.999

-99.965

2.2 RX Test

2.2.1 RX Test Environment Setup

image7

2.2.2 RX Sensitivity Test

  1. Test Method

  1. Frequency setting:

Set to LoRa RX test mode with 470.0 MHz frequency

  1. Signal generator setting:

  • Load related waveform for different SF

  • Measure the SNR threshold as below

RX Sensitivity Test Specification

SF

BW (KHz)

Package RSSI (dBm)

SNR Limit (dB)

SF7

125

<123

-7.5

SF8

125

-10

SF9

125

-12.5

SF10

125

<130

-15

SF11

125

-17.5

SF12

125

<135

-20

  1. Test Result

image8

2.3 Power Consumption Test

  1. Test Method

  1. Frequency setting:

Set to 470 MHz frequency under TX, RX, Standby and Sleep mode

  1. Multimeter setting:

Set the multimeter to current test mode

  1. AT Command:

  • TX: AT+CTXCW=470000000,22

  • RX: AT+CRX=470000000,0

  • Deep sleep: AT+CSLEEP=1

  1. Illustration

image9

  1. Test Result

image10

  1. Note

The power consumption test result is for ASR6601 SoC with front-end RF.